|
|
|
|
| |
|
 |
About Us
Nano-View is developing and producing the state of the art equipments that can measure and analyze the thickness, optical properties, composition ratio and the surface roughness of the semiconductor, conductor, dielectric and liquid thin films that are used in semiconductor devices , LCD displays and sollar cell.
Our current main products are the spectroscopic ellipsometers that can greatly reduce the measurement time and increase the accuracy as a result of our patented 'calibration and ...
|
|
 |
|
|
|
|
|
1. Fast spectroscopic data measurement : 5 sec for full spectra of ...
|
|
|
|
1. Fast spectroscopic data measurement : 5 sec for full spectra of ...
|
|
|
|
Rubbing Inspection
- 1-D (& 2-D) rubbing strength distribution can be ...
|
|
|
|
1. Moving head type (patent pending) - Unlimited sample size & ...
|
|
|
|
|
|
|
|
Company Name:
Bookmark / Share this page