 Model Number |
PV-ARC |
Application: Antireflective coating (ARC) on textured (poly-) crystalline silicon solar cell
Measurement: Thickness, Reflectivity, n&k
Wavelength: 420 - 950 nm (1.3-3.0 eV) : expandable
Accuracy (thickness measurement on specular sample): 104.5 nm for 104.8 nm SiO₂on c-Si
* Accuracy can be dependent on the quality of film
Thickness range: 10 nm ~ 20 mm (depend on sample)
Data acquisition time: < 1 s
Beam spot size: ~ 50 mm
Focusing of beam: Manual (optional auto-focus)
Sample stage: Manual X-Y stage (specify sample size and travel distance)
(optional automatic X-Y stage for mapping)
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