Home > Buy Now > Physical Measuring Instruments > Other Physical Measuring Instruments > Spectroscopic Ellipsometer
 


Nano-View Co., Ltd.
 
icon Products

line

icon Company Profile
icon Index
icon Bulletin Board
icon Guest Book

line



visitors: 1200
 
Contact us
Nano-View Co., Ltd.
[Korea]
Address:
Gyeonggi Small & Medium Business Center #906-5 Lui-dong, Yeongtong-gu Suwon Gyeonggi-do 443-766 Korea
Phone:
82-31-2596270
Contact name:
Jang-Bin Im , Assistant Manager
Inquire now









Nano-View Co., Ltd.
 
Products

Spectroscopic Ellipsometer

Inquire now

Spectroscopic Ellipsometer

Click to enlarge image

 Model Number Rubbins-1000

Rubbing Inspection

- 1-D (& 2-D) rubbing strength distribution can be mapped for whole LCD panel.

- Deviation by measurement positions is less than 10% Quick sample is possible.

- Signal difference among different rubbing condition is distinctive.

- Underlying important part and/or defect can also be distinctively measured.

- In-line or off-line measurement

- Thickness, refractive index {n, k} and uniformity measurement of any thin film layer including polyimide layer. (optional)

 

Mapping Stage (whole glass for any generation)

- Travel: 2280 mm × 1920 mm for 7-G

- Max.speed: 0.5 m/s

- Clean room quality

- Vacuum chuck and booth

 

Rubbing Inspection for LCD

Rubbing Strength Measurement for Process Control

Optical Axis Measurement in LC Alignment Layer

Whole Glass without Rotation, Off- & In-Line System

 

 


Related Keywords: Ellipsometer


Inquire now